by FASTMICRO
Equipment Others, Optical Surface Inspection
Fastmicro Sample Scanner
Surface cleanliness validation with 0.5 µm particle detection, objective reports and fast operator workflow.
INFOEquipment in our portfolio for further applications.
Surface cleanliness validation with 0.5 µm particle detection, objective reports and fast operator workflow.
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Wafer Expander for a variety of film frames and hoop sets up to 152 mm (6″)...
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Fully automated tabletop wafer bonder built for void free bonding.
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